New Paper published in Computers & Industrial Engineering

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Can unsupervised deep learning models compete with their supervised counterparts for visual defect detection while meeting the high safety standards of industrial quality assurance? The short answer is “yes, they can” as we could demonstrate in a recent study published in Computers & Industrial Engineering (CAIE) in collaboration with the Software Development Center (SDC) Dresden (Volkswagen AG).

Thanks to the co-authors Justus Zipfel (Volkswagen AG), Felix Verworner (SDC), Marco Fischer (SDC), Uwe Wieland (Hochschule für Technik und Wirtschaft), and Patrick Zschech (FAU Erlangen-Nürnberg).

The full paper is available via open access and can be found here.